JPH02129876U - - Google Patents

Info

Publication number
JPH02129876U
JPH02129876U JP3872989U JP3872989U JPH02129876U JP H02129876 U JPH02129876 U JP H02129876U JP 3872989 U JP3872989 U JP 3872989U JP 3872989 U JP3872989 U JP 3872989U JP H02129876 U JPH02129876 U JP H02129876U
Authority
JP
Japan
Prior art keywords
temperature detection
sockets
test equipment
temperature
measurement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3872989U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP3872989U priority Critical patent/JPH02129876U/ja
Publication of JPH02129876U publication Critical patent/JPH02129876U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
JP3872989U 1989-03-31 1989-03-31 Pending JPH02129876U (en])

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3872989U JPH02129876U (en]) 1989-03-31 1989-03-31

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3872989U JPH02129876U (en]) 1989-03-31 1989-03-31

Publications (1)

Publication Number Publication Date
JPH02129876U true JPH02129876U (en]) 1990-10-25

Family

ID=31547000

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3872989U Pending JPH02129876U (en]) 1989-03-31 1989-03-31

Country Status (1)

Country Link
JP (1) JPH02129876U (en])

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007225496A (ja) * 2006-02-24 2007-09-06 Espec Corp 環境試験装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007225496A (ja) * 2006-02-24 2007-09-06 Espec Corp 環境試験装置

Similar Documents

Publication Publication Date Title
US7123037B2 (en) Integrated circuit temperature sensing device and method
JPH02129876U (en])
KR20090003288A (ko) 열전기쌍을 갖는 회로 리드
SE8500476D0 (sv) Anordning for metning av elektroniska enheter
JPH0372376U (en])
JPS59104080U (ja) ヒ−タ付集積回路測定用ソケツト
JPS6338077U (en])
JPS6111907Y2 (en])
JPS61102042U (en])
JPH0361587U (en])
JP3597937B2 (ja) 試料加熱装置
JPH0457776U (en])
KR100555596B1 (ko) 적외선 카메라를 이용한 인쇄회로기판조립체 시험장비픽스쳐의 인쇄회로기판조립체 가이드 핀
JPS6112115U (ja) Ic試験装置の温度制御装置
JPS62150680U (en])
JPH0335488U (en])
JPS6218676U (en])
JPS62170543U (en])
JPH0612977U (ja) Icソケット
JPS6194779U (en])
JPS61163989U (en])
JPH038775U (en])
JPH0459147U (en])
JPS58189975A (ja) 高温テスト用icソケツト
JPS59162671U (ja) 半導体装置用高温試験装置